GRIPS 政策研究センター Policy Research Center

客員研究員

2013/2/4 Report No:12-18

Localized knowledge spillovers and patent citations: A distance-based approach (revised version)

著者
  • 村田 安寧日本大学大学院総合科学研究科
  • Nakajima RyoDepartment of Economics, Keio University
  • 岡本 亮介政策研究大学院大学
  • Tamura RyuichiCenter for Economic Growth Strategy, Yokohama National University
分野 経済学
言語 英語
要旨

We develop a new distance-based test of localized knowledge spillovers that embeds the concept of control patents. Using microgeographic data, we identify localization distance for each technology class while allowing for spillovers across geographic units. We revisit the debate by Thompson and Fox-Kean (2005a,b) and Henderson, Jaffe and Trajtenberg (2005) on the existence of localized knowledge spillovers, and find solid evidence supporting localization even when using fine-grained controls. We further relax the assumption of perfect controls, and show that our distance-based test detects localization for the majority of technology classes unless hidden biases induced by imperfect controls are extremely large.

キーワード localized knowledge spillovers, distance-based tests, microgeographic data, K-density, patent citations, control patents, sensitivity analysis
添付ファイル 12-18.pdf