GRIPS 政策研究センター Policy Research Center

客員研究員

2011/9/28 Report No:11-11

Localized knowledge spillovers and patent citations:A distance-based approach

著者
  • 村田 安寧日本大学大学院総合科学研究科
  • 中嶋 亮横浜国立大学大学院経済学部
  • 岡本 亮介政策研究大学院大学
  • 田村 龍一筑波大学大学院人文社会科学研究科
分野 経済学
言語 英語
要旨

The existence of localized knowledge spillovers found by Jaffe, Trajtenberg and Henderson
(1993) has recently been challenged by Thompson and Fox-Kean (2005). To
settle this debate, we develop a new approach by incorporating their concepts of control
patents into the distance-based test of localization (Duranton and Overman, 2005).
Using microgeographic data, we identify localization distance for each technology class
while allowing for cross-boundary spillovers, unlike the existing literature where localization
is detected at the state or metropolitan statistical area level. We find solid evidence
supporting localized knowledge spillovers even when finer controls are used. We further
relax the commonly made assumption of perfect controls, and show that the majority of
technology classes exhibit localization unless hidden biases induced by imperfect controls
are extremely large.

キーワード localized knowledge spillovers; distance-based tests; microgeographic data;K-density; patent citations; control patents
添付ファイル 11-11.pdf